MAXQ7667AACM/V+T【PDF 16/40 页】IC MCU-BASED DAS 16BIT 48-LQFP

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MAXQ7667

16-Bit, RISC, Microcontroller-Based,

Ultrasonic Distance-Measuring System

______________________________________________________________________________________

765

432

10 S1 S0

432

SYSTEM PROGRAMMING REGISTER

P1.0/TDO

P1.2/TDI

P1.1/TMS

P1.3/TCK

DVDDIO

INSTRUCTION REGISTER

POWER-ON

RESET

TAP

CONTROLLER

BYPASS

DEBUG REGISTER

SHADOW REGISTER

DVDDIO

READ

WRITE

DVDDIO

UPDATE-DR

MAXQ7667

MUX

DVDDIO

MUX

TO DEBUG

ENGINE

Figure 10. JTAG Interface Block Diagram

JTAG Interface

The joint test action group (JTAG) IEEE 1149.1 standard

defines a unique method for in-circuit testing and pro-

gramming. The MAXQ7667 conforms to this standard,

implementing an external test access port (TAP) and

internal TAP controller for communication with a JTAG

bus master, such as an automatic test equipment (ATE)

system. The MAXQ7667 JTAG interface does not allow

boundary scan. For detailed information on the TAP and

TAP controller, refer to IEEE Std 1149.1 “IEEE Standard

Test Access Port and Boundary-Scan Architecture” on

the IEEE website at www.standards.ieee.org.

The TAP controller communicates synchronously with

the host system (bus master) through four digital I/Os:

test mode select (TMS), test clock (TCK), test data

input (TDI), and test data output (TDO). The internal

TAP module consists of shift registers and a TAP con-

troller (Figure 10). The shift registers serve as transmit

and receive data buffers for a debugger. Maintain the

maximum TCK clock frequency to below 1/8 the system

clock frequency for proper operation.

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